低压ZnO—Bi_2O_3—TiO_2系材料的退火特性及显微结构(4)

The Annealing Properties and the Microstructure of Low Voltage ZnO Varistors (4)

研究了不同温度退火对ZnO—Bi_2O_3—TiO_2系材料相结构,显微形态及电特性的影响,得出:500℃以下退火材稳定并改善材料的电性能,超过500℃退火料的压敏电压升高,非线性特性变坏。

By using X-ray differaction, SEM and EDAX the phase structure the microstructure and the electrical properties of ZnO-Bi2O3-TiO2 system were studied at different annealing temperature. It is found that the varistor becomes stability when the annealing temperature less than 500℃. The breakdown voltage increased and the non-linear properties deteriorated when the annealing temperature more than 500℃.