摘要
Optical constants, n-refractive index and k-extinction coefficient have been determinedfor Al-N-F and Al-O-F dielectric thin films, with n approximate to 1.4 and k about 0.01,prepared in d. c. magnetron sputtering system. A new solar selective absorbing surface ofgraded Al-N on Al base layer with Al-N-F antireflection film has been fabricated, and agood agreement is obtained between computed and experimentally measured reflectances andabsorptances for the selective absorbing surface which has a solar absorptance around 0.97(as-deposited) and 0. 95 (heat-treated at 450℃ for 1 h in vacuum). The solar selective absorb-ing surface has also been analyzed by Auger and ESCA.
Optical constants, n-refractive index and k-extinction coefficient have been determinedfor Al-N-F and Al-O-F dielectric thin films, with n approximate to 1.4 and k about 0.01,prepared in d. c. magnetron sputtering system. A new solar selective absorbing surface ofgraded Al-N on Al base layer with Al-N-F antireflection film has been fabricated, and agood agreement is obtained between computed and experimentally measured reflectances andabsorptances for the selective absorbing surface which has a solar absorptance around 0.97(as-deposited) and 0. 95 (heat-treated at 450℃ for 1 h in vacuum). The solar selective absorb-ing surface has also been analyzed by Auger and ESCA.
基金
Project supported by the National Natural Science Foundation of China.
