摘要
本文简述了对CVV俄歇电子谱峰退自卷积得到固体表面价带电子占有态密度(DOS)的方法。并讨论了退自卷积的算法,尤其是新的计算方法——下降法。采用这种方法对一些假想和实际的态密度分布函数进行了自卷积计算及其结果的逆计算——退自卷积。获得较fdLM法更为满意的结果。
A method to obtain the occupied density of states(DOS) of a valence band by deconvoluting CVV Auger electronspectrum is introduced briefly. The calculating method of deconvolution; especially the noval ' Gradient method' are de-scribed. Self-convolution for some hypothetical functions and real density of states and their inverse calculations-de-convolution of the above results are carried out. The calculating results are sufficiently good in comparison with the othermethods (for example; fdLM).
出处
《真空科学与技术学报》
EI
CAS
CSCD
1991年第4期263-272,共10页
Chinese Journal of Vacuum Science and Technology