计量芯片数据溢出对智能电能表计量误差的影响

Influence on Metering Error of Smart Meters Caused by Date Overflow of Metering Chip

电网负荷的不断增加,增容措施的滞后,计量装置处在严重过负荷运行状态。这对智能电能表准确、稳定计量提出了更高的要求。某智能电能表在严重过负荷情况下出现误差大幅超差和计入反向有功的问题,本文对智能电能表外围采样电路、采样信号在计量芯片中各个环节的处理过程进行了定量分析,确认异常现象是由计量芯片在严重过负荷工况下数据溢出所诱发。实验室大电流过负荷试验结果验证了本文给出的分析结果的合理性,并给出了相应的解决方案。

Metering devices are under serious overload condition with rapid increasement of power load and delay of grid expansion. It is a great challenge for accurate and stable measurement of smart meter. Excessive error and reverse active power problems exist in some smart meters when they are under overload condition. The quantitative analysis of sample circuit and sampling signal process by the metering chip is conducted in this paper. It has been confirmed that the abnormal phenomenon is caused by date overflow of metering chip. The experiment results show that the analysis presented in this paper is valid. The corresponding solution is given in this paper.