石墨烯层数测量方法的研究进展

Progress in Measuremental Methods for Layer Numbers of Graphene

石墨烯具有高导电性、高韧度、高强度、超大比表面积等特点,在电子、航天工业、新能源、新材料等领域有广泛应用。对石墨烯层数测量方法的研究有助于深入理解石墨烯性能与微观结构之间的关系。本文着重阐述了包括光学显微镜、拉曼光谱、原子力显微镜和透射电镜等测量石墨烯层数的方法,同时比较了各种测量方法的优点及局限性,并指出石墨烯层数的测量方法还有待进一步完善。

Due to its high conductivity,high toughness,high strength and large specific surface area,graphene has been widely used in fields such as electronics,aerospace industry,new energy sources,advanced materials etc.Study on the measuremental methods for layer numbers of graphene helps us to further understand the relationship between the performance and microstructure of graphene. In this paper,several measuremental methods for layer numbers of graphene including optical microscopy,Raman spectroscopy,atomic force microscopy( AFM),transmission electron microscopy( TEM) etc are discussed. The benefits and limitations for each method are also described. After comparison of these methods it is also mentioned that the relative research should be further developed.