硅漂移(SDD)阵列探测器X射线能谱测量诊断

Silicon drift detector array for X-ray spectroscopy

采用最新的SDD探测器阵列测量HL-2A托卡马克等离子体软X射线(1～20keV)辐射的能谱,获得电子温度、Zeff、重金属杂质含量绝对值及其时、空分布。由于SDD探测器较之传统的Si(Li)探测器有体积小、计数率高(≥106/s),能量分辨和量子效率高,不需液氮冷却的特点,并采用高速ADC和海量缓存器,电子温度测量的时、空分辨能力接近汤姆逊散射和ECE等方法,而测量精确度、使用寿命、造价、抗干扰能力、适应性等方面优于后者,且信息获取量大,可获得多种等离子体参数而备受重视,是一种最先进的诊断手段。

The silicon drift detector (SDD) has state of the art high energy resolution and can be operated in room temperature. The array of SDD will be used to measure the X-ray spectroscopy of the HL-2A Tokamak, including the parameters of plasma electron temperature profile, Z_(eff) profile, concentration of metal impurities, and distribution of electron velocity. This is an advantageous semi-conductor detector for diagnosis of fusion plasma.