摘要
接触电阻和接触热阻是影响温差电器件性能的两个重要的工艺参数,直接反映器件制造的工艺水平。因此,对器件的接触电阻和接触热阻进行测试分析,将能够定量地了解现行工艺对器件温差电性能的影响程度。本文首先介绍接触电阻的测试方法和实验结果,然后利用所测的数据,再通过对器件输出功率特性的测试,间接地导出器件的接触热阻。据笔者所知,这是温差电器件接触热阻实测数值的首次报道。
An experimental investigation into the electrical and thermal contact resistances of thermoelectric device is reported. The electrical contact resistivity was determined by measuring the electrical resistance of thermoelement as a function of its length. The thermal contact resistivity was obtained by further measuring the power output of the device when operated in the Seebeck mode as a generator. The results provide, for the first time,a realistic estimation of thermal contact resistance of thermoelectric device.
出处
《红外技术》
CSCD
1993年第2期15-18,共4页
Infrared Technology