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Electron spectroscopies and their use for materials characterization 被引量:1

Electron spectroscopies and their use for materials characterization
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摘要 We present here a general overview of electron spectroscopies from a practical point of view. The most frequently used ones are described and the type of structural information they can provide on materials is explained in relation to the physical processes on which they are based. Furthermore, we explore critically and in detail various tools that have been developed to allow a systematic solving of structures by these spectroscopies. We present here a general overview of electron spectroscopies from a practical point of view. The most frequently used ones are described and the type of structural information they can provide on materials is explained in relation to the physical processes on which they are based. Furthermore, we explore critically and in detail various tools that have been developed to allow a systematic solving of structures by these spectroscopies.
出处 《Nuclear Science and Techniques》 SCIE CAS CSCD 2003年第1期28-48,共21页 核技术(英文)
基金 We are grateful to Francine Solal for a critical reading of the manuscript and for helpful comments.Zi-Yu WU acknowledges the financial support of the 100-Talent Research Program of the Chinese Academy of Sciences of the Outstanding Youth Fund(10125523) Key Important Nano-Research Project(90206032)of the National Natural Science Foundation of China.
关键词 低能电子衍射 X射线吸收光谱 X射线衍射 电子光谱 材料 表征 表面分析 应用 Electron spectroscopy, Materials characterization, Surface analysis
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