嵌入式存储器内建自测试的原理及实现

Principle and Implementation of Embedded Memory Built-in Self-test

随着集成电路设计规模的不断增大 ,在芯片中特别是在系统芯片 SOC( system on a chip)中嵌入大量存储器的设计方法正变得越来越重要。文中详细分析了嵌入式存储器内建自测试的实现原理 ,并给出了存储器内建自测试的一种典型实现。

With the growth of the scale of integrated circuits, the design method for a large number of memories embedded in the chip and particularly in the SOC is becoming more and more important. The principle of memory built-in self-test is analyzed in detail and a typical implementation of MBIST is given in the paper.