用正交回归、示波极谱法同时测定铟和锡之研究

Study on Simultaneous Determination of In and Sn with Regress-orthogonal Designs and Oseillopolarography

本文用双因素四水平正交设计回归分析法,建立了铟和锡在0.01％次甲基蓝和2.5％草酸底液中的示波极谱二次导数峰高与铟、锡浓度之间的两个非线性回归模型,并将此二模型用于铟、锡两组分共存体系的同时测定。与文献方法相比,本法具有两组分相对浓度允许范围宽的显著优点,为重叠不太严重的极谱体系中两组分同时测定提供了一种新方法。用于铝合金中铟和锡的同时测定,回收率在92.2～108.8％之间。

In a supporting solution of 2.5％oxalic acid with presence of 0.01％ methylene blue, two nonlinear regress models for relationships between oscillopolarographic secondary derivative peak height of In and Sn and their concentrations have been eatablished with orthogonal design-regress analysis,which have been used to simultaneously determine In and Sn in their coexistence systems. Compared with the literature, this method shows a marked advantage of wide range of relative concentration of two compounds, which provides a new method for simultaneous determination of two components in non-over-severe overlapping polarographic system. This method has been used in simultaneous deter-mnination of In and Sn in aluminiurn alloys with recovery or 92.2 to 108.8％.