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基于调制度测量轮廓术的测量系统研究 被引量:2

The study of the measurement system based on modulation measurement profilemetry
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摘要 调制度测量轮廓术可以实现对物体的垂直测量 ,特别适合于探测表面有高度剧烈变化或不连续区域的物体 ,研究实用的基于调制度测量轮廓术的测量系统对三维传感和机器视觉有重要意义。本文从调制度测量轮廓术的原理出发 ,分析了获取条纹调制度信息的原理 ,提出了两种易于实现仪器化的垂直扫描方法 ,提出了调制度测量轮廓术的实验系统设计方法和步骤 ,给出了模拟实验结果。 It is significant to study the practical technique based on Modulation Measurement Profilemetry(MMP)that can measure the complex surface of a testing object without the difficulties due to shadow and spatial discontinuity.This paper proposed two new practical scanning techniques,by which,the imaging plane of the grating can scan the whole testing object without moving the projecting system or the testing object.Then it discussed several factors that affect the measurement accuracy in detail.The computer simulating results were presented at last.
出处 《激光杂志》 CAS CSCD 北大核心 2004年第4期34-36,共3页 Laser Journal
关键词 调制度焦深 调制度测量轮廓术 modulation measurement profilemetry depth-of-modulation
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