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多传感器融合系统的可靠性模型研究 被引量:8

Study of Reliability Model for the Multi-Sensor Fusion System
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摘要 为有效评价多传感器融合系统硬件的可靠性,提出了一种新的三模冗余结构(TMR)半马尔可夫过程模型.该模型以系统单元寿命服从负指数分布、系统单元修复时间服从广义任意分布(修复率是时间的函数)为前提,通过引入补充变量,可以转化为马尔可夫过程模型进行求解,从而获取系统有效性和可靠性的一些重要指标.理论分析和数值结果表明,传统可靠性建模的方法可以作为新模型简化的特例,利用新模型的TMR冗余结构多传感器融合系统与无冗余的单传感器系统相比,系统的平均无故障时间(MTBF)提高了两个数量级.因此,提出的新模型可以准确地描述系统的实际工作状况,为有效评估多传感器融合系统可靠性提供了理论依据. A novel semi-Markov process model based on three-model redundant (TMR) architecture is proposed to effectively evaluate the hardware reliability for multi-sensor fusion system. The semi-Markov process mode is established under the condition that the natural life of each unit of the system is assumed to confirm with a negative exponential distribution and repair time of each unit with generalized arbitrary distribution where the repair rate is considered as a function of time. Simultaneously, the novel model is converted to Markov process model by supplementary variable, and then some universal reliability and availability indices of the system model are obtained. Theoretical analysis and numerical result confirm that the traditional method can be regarded as a special case of the proposed model. Furthermore mean time between fail (MTBF) of the TMR system employing proposed model for the multi-sensor fusion two order of magnitude increases over the single sensor system. The semi-Markov process model illustrates more accurately the operating characteristics of the system and provides theoretical basis to evaluate effectively the reliability of the multi-sensor fusion system.
作者 李军 刘君华
出处 《西安交通大学学报》 EI CAS CSCD 北大核心 2004年第8期775-778,795,共5页 Journal of Xi'an Jiaotong University
基金 国家自然科学基金资助项目(60276037).
关键词 多传感器融合系统 半马尔可夫过程 有效性 可靠性 Availability Markov processes Mathematical models Reliability
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参考文献3

  • 1Paula H M, Roberts M W, Battle R E. Reliability performance of fault-tolerant digital control systems[J]. IEEE Trans on Reliability,1995,44(3): 413-418.
  • 2Perman M, Senegacnik A, Tuma M. Semi-Markov models with an application to power-plant reliability analysis[J]. IEEE Trans on Reliabilty, 1997, 46(4): 526-532.
  • 3Marzullo K. Tolerating failures of continuous-valued sensors[J].ACM Trans on Computer System, 1990,8(4):284-304.

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