银基触头材料电弧侵蚀特性及裂纹形成机理分析(英文)

THE ARC EROSIVE CHARACTERISTICS AND CRACK FORMATION MECHANISMS ANALYSIS OF SILVER-BASED CONTACT MATERIALS

利用数字显示时间继电器、交流接触器、断路器以及电阻性负载设计了一个简易的触头材料实验电路。用该实验电路对五种银基触头材料AgCdO(12),Ag(Sn,In)O,AgZnO(10),AgNi(10),AgC(5)根据不同的开断电流、开断次数、闭合压力和配对方式进行了电弧侵蚀实验。根据实验结果得到了一些有实际意义的电弧侵蚀特性曲线。然后根据不同的开断电流及闭合压力对裂纹形貌进行了分析研究。最后,基于数学分析给出了用于判定出现滑移裂纹和热应力裂纹的理论判据。

The simple experimental circuit contact material is designed using time relays with digital display, contactors, switchgear and resistive load. The breaking arc experiments on five kinds of silver-based contact materials, AgCdO (12), Ag (Sn, In)O, AgZnO (10), AgNi (10), AgC (5) are carried out in terms of different breaking currents, breaking times, closed pressures and paired manner. The arc erosive characteristics obtained from the experiments show valuable results. The study on crack morphology analysis of silver-based contact materials are carried out according to the various breaking currents and various contact closed forces. Lastly, the simple theoretical criteria for judging whether the slipping crack or thermal stress crack will appear are presented based on mathematical analysis.