X-射线衍射法测定尼龙1010结晶度

CRYSTALLEVITY DETERMINATION OF NYLON 1010 BY WIDE-ANGLE X-RAY DIFFRACTION

根据X-射线散射强度理论,使用图解多重峰方法对尼龙1010三个结晶峰及非晶峰的衍射强度进行校正,首次导出了尼龙1010结晶度计算公式,所得结果与密度及量热测定结果具有很好可比性。

Using the atomic scattering factors approximation expression and corrections for angle and temperature, the correct factors of three main crystal planes and amorphous state of nylon 1010 by wide angle X-ray diffraction (WAXD) have been calculated. The equation for the determination of crystallinity of nylon 1010 by WAXD is presented.