期刊文献+

程序插装技术在软件内建自测试中的应用 被引量:6

Application of Program Instrumentation in Built-In-Self-Test for Software
下载PDF
导出
摘要 软件内建自测试(Build-In-Self-TestforSoftware)思想来自于硬件内建自测试。其中测试点设置是软件内建自测试系统的核心模块之一,主要借助程序插装技术收集动态测试信息和控制程序流程。该文具体讨论了插装库的设计、实现以及测试点植入被测程序的过程。 The concept of BIST(Built -In -Self -Test)for software is borrowed from BIST for hardware.Checkpoint mounting,which is one of the kernel modules of BIST system for software,is used for collecting dynamic test information and controlling the executing path of software.In this paper,we discusse the design and implementation of instrumentation library and the process of installing checkpoints into the program under test.
出处 《计算机工程与应用》 CSCD 北大核心 2004年第17期117-118,229,共3页 Computer Engineering and Applications
基金 国家自然科学基金项目:软件可测性设计新概念研究-BISTforSoftware(编号:60173029 2002)资助
关键词 软件测试 内建自测试 可测性 测试点 程序插装 software testing,Built-In-Self-Test(BIST),testability,checkpoint ,program instrumentation
  • 相关文献

参考文献4

  • 1刘穆进,徐拾义.软硬件测试的一致性[J].同济大学学报(自然科学版),2002,30(10):1186-1189. 被引量:7
  • 2J C HUANG.An Approach to Program Testing. Department of Computer Science,University of Houston,Houston,Texas 7700
  • 3J C Huang. Program instrumentation and software testing[J].Computer,1978;11(4):3
  • 4Yingxu Wang,Graham King,Hakan Wickburg. A Method for Built-in Tests in Component-based SoftwareMaintenance

二级参考文献12

  • 1Ohtake S,Inoue T,Fujiwara H.Sequential test genera tion based on circuit pseudo-transformation[A].Proceedings of the 5th Asian Te st Symposium[C].Taiwan:Institute of Electrical and Electronics Engineers,1997. 62-67.
  • 2Waicukauski J A,Lindbloom E,Rosen B,et al.Transition fault simulation[J].IEEE Design and Test of Computers,1987,(4):32-38.
  • 3Ramamoorthy C V,Bastani F B.Modelling of software reliabil ity growth process[A].Proc COMPSAC 1980[C].Chicago:COMPSAC,1980.161-169.
  • 4Ramamoorthy C V,Bastani F B.Software reliability--status and perspectives[J].IEEE Trans Soft Eng,1982,(4):354-371.
  • 5Savaria Y.A pragmatic approach to the design of self-testi ng circuits[A].1989 Int Test Conf[C].Washington:IEEE Pub,1989.745-754.
  • 6Wagner K D,Chin C K,Mc Cluskey E J.Pseudorandom testing[J ].IEEE Trans on Computers,1987,C-36(3):332-343.
  • 7Malaiya Y K.Antirandom testing:Getting the most out of bla ck-box testing[A].Sixth Int Symp on Soft Reliability Engineering[C].Tou Lous e:[s.n.],1995.86-95.
  • 8Cheng K T,Agrawal V D.A partial scan method for sequ ential circuits with feedback[J].IEEE Trans Comp,1990,39(4):538-544.
  • 9Kim K S,Kime C R.Partial scan flip-flop selection by use of empirical testability[J].JETTA,1995,7(1-2):47-60.
  • 10Weiser M.Program slices:Formal,psychological,and practical investigation of an automatic program abstraction method[D].Ann Arbor:University of Michiga n,1979.

共引文献6

同被引文献47

引证文献6

二级引证文献33

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部