摘要
BIT技术在数字电路测试中取得了巨大的成功。而模拟电路的特点决定了BIT技术在其应用存在一定的难度。笔者对模拟和混合扫描总线、模拟BIT。
Built-in test(BIT) technique has achieved great success in digital signal circuit design for testability (DFT).However,BIT applied in analog signal circuit has some difficulties because of characters of analog signal.A review of analog and mixed signal test bus,analog signal BIT and mixed signal BIT is proposed.
出处
《测控技术》
CSCD
2004年第6期18-20,共3页
Measurement & Control Technology
关键词
BIT
模拟和混合扫描总线
模拟BIT
混合BIT
built-in test
analog and mixed signal test bus
analog signal BIT
mixed signal BIT
