采用自动双探边器降低芯片漏测率

Reduction Chip-testing System Leaving Out Rate by Using Double Edgedetectors

半导体芯片的检测是芯片生产企业生产过程中的重要环节 ,芯片在检测过程中 ,由于圆形硅片的结构特点而造成的漏测又是困扰芯片生产企业不可小视的实际问题。

Semiconductor chip testing is very important for wafer fabrication.This paper discussed the valid and suitable method to reduce the leaving out rate of the chiptesting system by using double edgedetectors.