摘要
在分析标准I/O盖片现存问题的基础上,通过设计及工艺改进,不仅降低了工艺要求,而且彻底解决了I/O盖片易“脱落”和“泄磁”的现象,其产品很受市场欢迎。
Based on analyzing subsistent problems of standard I/O shield cover, with the development on design and technique, not only falling down the technical demand, but also solving the phenomenon of 'desquamating' and 'discharging magnetism' in grain, the product have been welcomed hotly by market.
出处
《机械工程师》
2004年第7期52-53,共2页
Mechanical Engineer
关键词
电脑机箱
I/O盖片
电磁辐射
泄磁
computer case
I/O shield cover
electron magnetic interference
discharging magnetism
