钨合金切屑回收粉中11种杂质元素的发射光谱测定

Emission Spectrochemical Determination of Eleven Impure Ele-ments in Reduction Reclamation Powder of Tungsten Alloy Chips

本文介绍用氟化钠作载体,采用载体分馏法,以直流电弧阳极激发,在PGS-2平面光栅摄谱仪上,样品不经分离、富集,一次摄谱,同时测定钨合金切屑回收粉中硅、锰、钙、铝、镁、铅、铬、铜、锑、钼和锡11种杂质元素的发射光谱分析方法。测定下限达0.6-1Oppm,回收率为95.3-103.4%。

Emission spectrmetric determination of eleven impure elements (Si, Mn, Ca, Al, Mg, Pb, Cr, Cu, Sb, Mo and Sn) in reductin reclamatin powder of tungsten alloy chips, with sodium fluoride carrier, carrier distillation method, DC arc excitation source, samples as anode, without separation and concentration, by means of PGS-2 plane-grating spectrograph is reported in this paper. The detection limits of each ele- ments are between 0.6 and 10 ppm, the recovery rates being 95.3-103.9%, the relative standard deviations are 3.3-10.5%. This method has been applied to the direct determi- nation of eleven impure elements in raclamation powder of tungsten alloy chips with sat- isfactory results.