摘要
本文介绍了用日本理学3530XRF光谱仪扫描道测定钢中痕量元素As、Sn、Sb。由于短波强大的背景破坏了检测线的线性,通过用DATAFLEX 181B背景扣除的数据处理,消除了这些影响,成功地校准了曲线。方法简单;快速;XRFS结果与化学分析一致,该法已用于炼钢的过程控制和原材料分析。
This paper describes a method for determination of trace elements As, Sn, Sb in steel by scan channel of Rigaku 3530 XRF spectrometer. The linearity of the analytical calibration curve is disturbed by the strong spectra background. The in terference has been resolved by means of data process of background subtraction with DATAFLEX 181B and the curves were corrected successfully. The method is simple, rapid and the results of XRFS are coincident with that of chemical analysis. Now the method has been adopted as a process control in making steel and raw ma- terial analysis.
出处
《光谱实验室》
CAS
CSCD
1993年第5期50-51,28,共3页
Chinese Journal of Spectroscopy Laboratory
关键词
钢
砷
锡
锑
X射线
荧光光谱分析
Scan Channel
XRF Spectrometer
Background Subtraction
XRFS Analysis
