用ICPS-PGS2扫描直读光谱仪直接测定高纯氧化铥中的十四个稀土杂质

DETERMINATION OF 14 RARE EARTH IMPURITIES IN HIGHLY PURE THULIUM OXIDE BY MODEL ICPS-PGS2 SCANNING INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETER

本文选出了用改装的ICPS-PGS2单道扫描直读光谱仪直接测定高纯氧化铥中十四种稀土杂质的最优测量条件。考查了氧化铥基体对被测稀土元素的干扰和稀土元素间的相互干扰。在优化实验条件下,本方法测定下限为在10^(-2)～10^(-4)%之间,标准加入回收值在86.6%～115%之间,样品分析的相对标准偏差小于6.7%。本方法可适用于纯度小于99.95%氧化铥中十四个稀土杂质的例行分析。

A method is presented for the determination of 14 rare earth impurities in highly pure thulium oxide by model ICPS-PGS2 scanning inductively coupled plasma atomic emission spectrometer, which was reequiped with microcomputer-controlled and data readout system based on the Ziess PGS-2 grating spectrograph. The optimum condition of the equipment and effect of matrix are studied. Detection limits, recoveries and relative standard deviations for 14 rare earth impurities range from 0.01 to 0.61μg/ml, 86% to 115% and 0.39% to 6.7%, respectively. The method could be used to determinate 14 rare earth impurities in highly pure thulium oxide with a purity of less than 99.95%, and the result is satisfactory.