摘要
用谱线宽度方法定量检测了硅铋样品中含量为70%的铋,相对误差小于7.15%,相对标准偏差为5.85%。讨论了电极间距、曝光时间、工作电流和显影时间对分析线对宽度差之影响。
The quantitative determination of 70% bismuth in silicon-bismuth samples were completed by line width method. The relative error is less than 7.15%, the relative standard deviation is 5.85%. The influence of the distance between both electrodes, exposure time, working current, and developed time to the width differences of analytical line pair were discussed.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1993年第3期41-44,92,共5页
Spectroscopy and Spectral Analysis
关键词
谱线宽度法
铋
高含量
Line width method, Bi, High content