磁光盘微光斑参数实时测量的频谱分析法

FREQUENCY ANALYSIS OF REALTIME MEASUREMENT FOR MICRON SIZED LASER BEAM PARAMETERS IN MAGNETOOPTIC DISC

本文在频域对磁光读出过程进行了分析,提出了一种方便实时测量磁光存储系统中的微光斑参数的新方法——频谱分析法。误差分析表明,该方法精度高,易于实现。

Magneto-optic readout process in frequency domain has been analyzed in this paper. A new method-real time frequency analysis method has been developed, which can conveniently measure the micro-beam parameters in magneto-optic storage system. The analysis of errors indicates that the method is simple and has high accuracy.