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基于IEEE 1149.4标准的验证电路设计 被引量:2

Design of the Verification Circuit Based on IEEE 1149.4 Standard
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摘要 介绍了基于IEEE 114 9.4混合信号测试总线标准的验证电路设计 ,利用复杂可编程逻辑器件 (CPLD)、模拟开关ADG2 0 2A和电压比较器LM311等器件 ,实现了该标准所定义的测试结构。它的设计与可观性实验及可控性实验验证了标准的有效性 ,对于今后推广标准在混合信号芯片中的应用将起到积极的作用。 A method of designing a verification circuit based on IEEE standard for a mixed-signal test bus is introduced. By using a CPLD, analog switches ADG202A and voltage comparators LM311, the boundary-scan test architecture compliant to the standard is implemented. Its design and implementation verified the standard’s effectiveness, and will play an important role in promoting its application in mixed-signal chips in the future.
出处 《电子工程师》 2004年第9期10-13,共4页 Electronic Engineer
关键词 IEEE 1149.4标准 边界扫描 验证电路 电路测试 IEEE 1149.4 standard , boundary scan, verification circuit, circuit test
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参考文献4

  • 1IEEE Standard for a Mixed-signal Test Bus. IEEE 1149. 4.1999
  • 2Parker K, McDermid J, Oresjo S. Structure and Metrology for an Analog Testability Bus. In: Proceedings of IEEE International Test Conference. New York: IEEE Computer Society,1993. 309-22
  • 3Cheek D, Dandapani R. Integration of IEEE Std 1149. 1 and Mixed-signal Test Architectures. In: Proceedings of IEEE International Test Conference. New York: IEEE Computer Society, 1995. 569 -576
  • 4李正光,雷加.基于IEEE1149.4的测试方法研究[J].电子工程师,2003,29(4):10-13. 被引量:8

共引文献7

同被引文献13

  • 1马少霞,孟晓风,钟波.基于边界扫描技术的测试系统设计[J].电子技术应用,2006,32(1):95-97. 被引量:6
  • 2张西多,易晓山,胡政.基于IEEE1149.4的混合信号边界扫描测试控制器设计[J].计算机测量与控制,2006,14(5):570-572. 被引量:10
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  • 4IEEE. IEEE Standard for mixed-- signal test bus [S]. Institute of Electrical and Electronic Engineers, Inc, 2000.
  • 5Mark Burns,Gordon W.Roberts. An Introduction to Mixed-Signal IC Test and Measurement[M]. New York:Oxford University Press, 2001:569- 571.
  • 6刘林生 张东.印制电路板在线故障诊断技术探讨.电子测量与仪器仪表学报,2010,:158-161.
  • 7Kenneth P. Parker. The Boundary-Scan Handbook: Analog and Digital[M], Second Edition. New York: Kluwer Academic, 2002: 221-226.
  • 8Michael L.Bushnell,Vishwani D.Agrawal. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits[M] New Youk:Kluwer Academic,2002:575-591.
  • 9Kenneth P. Parker. The Impact of Boundary- Scan on Board Test[J]. IEEE Design and Testof Computers, 1989, 6: 18-30.
  • 10Test Technology Standards Committee of IEEE Computer Society.IEEE Standard for a Mixed-Signal Test Bus[S]. IEEE Std 1149.4- 1999,New York,1999.

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