摘要
质子激发X射线发射(PIXE)分析是近年发展起来的一种新的微量分析技术。由于传统方法所要求的薄靶制样等方面的困难,迄今它在地质样品方面的应用尚不多见。本工作针对地质样品的特点,尝试了简单、方便的厚靶制样法,并采用计算机处理技术解决了由此而引起的复杂的理论校正问题。对若干USGS岩石标准样作了试分析,结果是令人满意的,从而为微量元素的地球化学研究开辟了一条新的途径。
In PIXE quantitative analysis the thin-target-method is routinely employed to av-oid sophisticated corrections for proton energy loss and X-ray absorption. However, it is extremely difficult to prepare a thin target, especially for powdered geological sam-ples. In this work the simple thick-target sampling technique was adopted and a micro-computer was employed for making corrections on the basis o'f the theory. In this way, 4 USGS standard rock samples were analyzed with reasonably good results achieved.All the experimental work was done at the Lawrence Berkeley Lab (LBL), Univ. of California,USA. Samples were pelletized into a. φ8 X lmmhole on a .graphite substrate and then uniformly coated with aquadag to ensure good electric conductivity.The trace elements analyzed are Y, Zr, Rb. Sr, Th, Ge and Zn. The results are in substantial agreement with their certificated values with a relative error of 10-30% depending on the concentration, which is undoubtedly acceptable in view of trace elem-ent analysis.
出处
《地球化学》
CAS
1986年第3期251-258,共8页
Geochimica
