安培力微观机制探原

RESEARCH FOR THE MICROMECHANISM OF AMPER'S FORCE

通过对磁场中载流金属导体内电子或半导体内载流子的受力分析,以及它们和金属或半导体晶格之间的相互作用,阐明了安培力的经典微观起源。

The classical micromechanism of Ampere's force can be explained by analysing the forces on the electrons in a current-carrying metal conductor or on the carriers in a semiconductor and the interaction between the electrons and the crystal lattice of metal or between the carriers and the crystal lattice of semiconductor.