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GC/MS/AMDIS技术用于韭菜中残留农药的确证 被引量:26

Confirmation of Pesticides in Leek Using Gas Chromatography-Mass Spectrometry-Auto Mass Deconvelution & Identification System
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摘要 采用自动质谱退卷积定性系统 ( AMDIS)、Varian数据处理系统、NIST98谱库检索系统对韭菜中有机磷、有机氯、氨基甲酸酯等三类农药的 1 7种农药残留进行确证分析 ,比较三种检索定性技术对添加不同浓度( 0 .1、0 .5、0 .2 mg/ kg)农药的样品中农药的检出结果。结果表明 :AMDIS的确证结果最为理想 ,对 GC/ MS全扫描文件进行退卷积处理可有效解决基质的干扰问题 ,农药添加浓度越低 ,检索优势越为明显 ,同时可获得足够的信息量 ,准确对目标化合物进行定性。整个操作过程自动完成 。 Auto Mass Spectral Deconvolution & Identification System(AMDIS), Varian date processing system and NIST98 MS Search System were used to confirm 17 pesticides in leek samples, which were spiked different concentrations (0.1, 0.5, 2mg/kg) of pesticide in organophosphrous, organochlorine and carmbamate. The results showed AMDIS could effectively remove the matrix interference through comparing with the confirmation results, and the effect is idea with the low concentration of pesticides in complex samples. Available information help to accurate qualitation of detected compounds. The system procedure is automated, short and repid.
出处 《质谱学报》 EI CAS CSCD 2004年第3期141-144,171,共5页 Journal of Chinese Mass Spectrometry Society
关键词 韭菜 残留农药 气相色谱-质谱 自动质谱退卷积定性系统 定性测量 mass spectrometry confirmation of pesticides residue gas chromatography-mass spectrometry (GC/MS) AMDIS qualitation leek
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  • 1Ma Xiaodong, Li Chongjiu, Tao Chuanjiang, et al. Multi-residue Determination of 41 Insecticides in Garlic by Gas Chromatography and Ion Trap Mass Spectrometry Using the Selective Ion Storage Technique [J]. Rapid Commun Mass Spectrom, 2001,(15): 15~19.
  • 2Halket JM, Przyborowska A, Stein SE, et al. Deconvolution Gas Chromatography/Mass Spectrometry of Urinary Organic Acids-potential for Pattern Recognition and Automated Identification of Metabolic Disorders[J]. Rapid Commun Mass Spectrom, 1999, (13): 279~
  • 3Shai Dagan. Comparison of Gas Chromatographypulsed Flame Photometric Detection-Mass Spectrometry, Automated Mass Spectral Deconvolution and Identification System and Gas Chromatography-Tandem Mass Spectrometry as Tools for Trace Level Detection and Identi

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