小波变换用于半导体激光器可靠性分析

Wavelet Transform for Evaluation of Semiconductor Laser Reliability

应用小波变换奇异性检测原理 ,对近百只半导体激光器 (L D)输出 I- V特性进行小波变换 ,通过不同尺度下的变换系数 ,能够真实、准确地测量和计算半导体激光器的阈值电流以及与可靠性相关的一些参数 ,模极大值 WM2 j,结特征参量 m等。利用这些计算和测量参数 ,可以直观地比较和判别出半导体激光器的性能优劣及可靠性 ,与电导数法相结合 ,可方便、准确、快捷地对器件性能和可靠性进行评估筛选。理论与实验表明 ,利用小波变换进行半导体激光器的可靠性分析与传统方法相比具有独到之处。

In this paper, based on the wavelet transform′s singularity detection principle, the transform coefficients at different scales were given to examine output I-V curve and compute the threshold current and other correlative parameters, such as the modular max WM_ _ 2j and junction characteristic parameter m and so on. Making use of the above examined parameters combining with electrical derivative method, the reliability of semiconductor laser and quality of device can be compared directly and evaluated accurately. The theory and the experiment indicate that compared with the other classic methods, this method is distinct.