期刊文献+

单晶硅氩离子注入层的微观结构和微观摩擦磨损行为

Micro-Wear Mechanism and Micro-structure of Argon Implanted Single-crystal Silicon
下载PDF
导出
摘要 利用离子注入技术对单晶硅表面进行了氩离子注入,用微摩擦磨损实验机研究了改性层的摩擦磨损行为,并用透射电子显微镜研究了改性层的微观结构.结果表明:经过一定剂量的氩离子注入后单晶硅的耐磨性能较注入前有了一定的提高,其中以注入剂量1×1016ions/cm2为最好,氩离子的注入使单晶硅表面形成了硅的微晶态与非晶态共存的混和态结构的改性层,使其具有良好的抗塑变和塑性剪切能力,从而改善了单晶硅的抗磨能力. The micro-tribological and nano-mechanic properties of Ar^+ implanted single-crystal silicon were investigated by using a Micro-tribology Text and a Nano Indenter System, The results show that Ar^+ implantation of single-crystal silicon had increased the wear-resistance, the best dose is 1×10^(16) ions /cm^2. The mixed structure of micro-crystal and amorphous silicon is formed on the surface of single-crystal silicon. This contributes to increase the ability to resist plastic shear and raise the anti-wear ability of single-crystal silicon.
出处 《化学研究》 CAS 2004年第3期6-8,22,共4页 Chemical Research
基金 国家自然科学基金资助项目(50172052 50175105) 中科院百人计划资助项目.
关键词 单晶硅 离子注入 表面改性 微观结构 微观摩擦磨损行为 微型机电系统 氩离子 半导体 single-crystal silicon ion implantation wear mechanism nano-indentation
  • 相关文献

参考文献7

  • 1Gupta B K, Bharat B. Nanoindentation studies of ion implanted silicon[J]. Surf Coat Techn, 1994, 68-69: 564-570.
  • 2Kodali P, Hawley M. Tribological properties of carbon- and nitrogen-implanted Si(100)[J]. Wear, 1997,205: 144-152.
  • 3Xu Tao, Lu JingJun, Xue QunJi, Effect of ion mixing by C+ implantation on friction and adhesion of amorphous carbon film on SiO2 [J]. Mater Sci Engin A, 2000,284:51-55
  • 4Miyamoto T,Miyake S. Wear resistance of C+-implanted silicon investigated by scanning probe microscopy[J]. Wear, 1993,162-163:733-738.
  • 5Xu Tao, Tian Jun, Xue QunJi, The influence of nitrogen ion implantation on the wear behavior of single-crystal silica[J].J Phys D:Appl Phys, 2000,33: 426-429.
  • 6Lu JinJun, Xu Tao, Zhang Pingyu,et al. Effect of C implantation on the structure and tribological properties of three metal/SiO2 systems [J]. Thin Solid Films,2002,416: 153-159.
  • 7Lim M G, Chan J C, Schults D P,et al. MEMS90[C]. 1990:82.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部