期刊文献+

掺In对反型AlGaAs/GaAs异质界面质量的改善及其应用

Indium Doping to Improve Heterojunction of AlGs/Gsand Its Application
下载PDF
导出
摘要 研究了 Al Ga As层掺 1%的 In对 Al Ga As/Ga As量子阱光致发光谱的半峰宽的影响 .2 5 K的光致发光结果表明 ,In作为表面活化剂能有效改善 Al Ga As/Ga As异质界面的粗糙度 .将此方法应用到反型 Al Ga As/Ga As高电子迁移率晶体管 (HEMT)材料结构中 ,Hall测量表明该方法能有效提高反型 Effects of In doping on the optical properties of AlGs/Gs quantum wells (QWs ) and the electrical properties of inverted AlGs/Gs high electron mobility t ransistors (HEMTs) are investigated.It is found that a little In incorporation i n AlGs layers can decrease the photoluminescence linewidths of AlGs/Gs QWs drastically and a little In doping in AlGs layer can significantly increase t he electron mobilities of inverted AlGs/Gs HEMTs at 77K.All these results de monstrate that In doping can reduce the interface roughness due to In as a surfa ctant which can enhance the surface migration of Al adatoms during molecular bea m epitaxy.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第9期1128-1131,共4页 半导体学报(英文版)
关键词 量子阱 高电子迁移率晶体管 界面粗糙度 光致发光 表面活化剂 quantum wells high electron mob ility transistor interface roughness photoluminescence surfactant
  • 相关文献

参考文献10

  • 1[1]Wilson L R,Keightley P T,Cockburn J W,et al.Controlling the performance of GaAs-AlGaAs quantum-cascade lasers via barrier height modifications.Appl Phys Lett,2000,76:801
  • 2[2]Brown A S,Metzger R A,Henige J A,et al.Effect of Simovement on the electrical properties of inverted AlInAs-GaInAs modulation doped structures.Appl Phys Lett,1991,59:3610
  • 3[3]Khler K,Ganser P,Maier M,et al.Modulation doped inverted and normal GaAs/AlxGa1-xAs heterostructures:influence of Si-segregation on the two-dimensional electron gas.J Cryst Growth,1991,111:295
  • 4[4]Pfeiffer L,Schubert E F,West K W,et al.Si dopant migration and the AlGaAs/GaAs inverted interface.Appl Phys Lett,1991,58:2258
  • 5[5]Cho N M,Kim D J,Madhukar A,et al.Realization of highmobility in inverted AlxGa1-xAs/GaAs heterojunctions.Appl Phys Lett,1988,52:2037
  • 6[6]Noda T,Tanaka M,Sakaki H.Correlation length of interface foughness and its enhancement in molecular beam epitaxy grown GaAs/AlAs quantum wells studied by mobility measurement.Appl Phys Lett,1990:57:1651
  • 7[7]Hayakawa T,Suyama T,Takahashi K,et al.Interface disorder in GaAs/AlGaAs quantum wells grown by molecular beam epitaxy at high substrated temperature.Appl Phys Lett,1985,47:952
  • 8[8]Basu P K.Theory of optical process in semiconductors.New York:Oxford University Press Inc,1997
  • 9[9]Morishita Y,Nomura Y,Goto S,et al.Effect of hydrogen on the surface-diffusion length of Ga adatoms during molecular-beam epitaxy.Appl Phys Lett,1995,67:2500
  • 10[10]Yang Bin,Cheng Yonghai,Wang Zhanguo,et al.Study onscattering mechanism of GaAs/AlGaAs two-dimensional electron gas (2DEG).Chinese Journal of Semiconductors,1995,16(4):248(in Chinese)[杨斌,陈涌海,王占国,等.GaAs/AlGaAs二维电子气(2DEG)散射机理研究.半导体学报,1995,16(4):248]

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部