期刊文献+

用于离子束辅助镀膜的两种模式端部霍尔离子源的比较 被引量:5

Comparative analysis of two patterns of end-Hall ion sources for ion beam-assisted deposition
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摘要 介绍了一种用于离子束辅助沉积光学薄膜的端部霍尔离子源的工作原理,并论述了端部霍尔离子源的离子能量、离子分布特性的测试方法;详细论述了电磁场和永久磁场两种模式下,端部霍尔离子源的工作稳定性、离子能量大小以及离子束分布特性的比较。 End-Hall ion source has been successfully developed for optical thin film coating by ion beam-assisted deposition (IBAD). Its operating principle and methods to test ion beam characteristics are introduced. Two patterns of end-Hall ion source using electromagnet coil or permanent magnet are comparatively analysed for ion energy and distribution.
出处 《真空》 CAS 北大核心 2004年第5期38-41,共4页 Vacuum
关键词 离子束辅助镀膜 端部霍尔离子源 电磁场 永久磁场 ion beam-assisted deposition (IBAD) end-Hall ion source electromagnetic field permanent magnetic field
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参考文献5

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共引文献13

同被引文献22

  • 1尤大伟,任荆学,黄小刚,武建军.关于辅助沉积霍尔离子源的几个问题[J].真空科学与技术学报,2004,24(4):279-282. 被引量:4
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