高气压电离室及其信号输出电路的温度效应的研究

Temperature effect of the high pressure ionization chamber and its output circuits

研究了高气压电离室、输出电路部分随温度改变时对脉冲信号频率产生的影响,为电离室及输出电路的设计提供了依据。

The influence of temperature change on the high pressure ionization chamber and its A- F converter output circuits is studied. The experimental result is useful for the design of these devices.