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电子封装中极易出现的几个问题 被引量:1

Some Problems During Packaging and Testing
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摘要 微电子产业已逐渐演变为设计、制造、封装三个既紧密联系又相对独立的产业,与前面两个环节相比,封装涉及的范围广,带动的基础产业多。本文论述了封装制程中经常出现的问题,分析了它们产生的原因和可能造成的危害,并对封装中应力的作用以及湿气引起的腐蚀等问题作了一些较深入的讨论。
作者 褚骏 戎蒙恬
出处 《世界电子元器件》 2004年第7期82-84,共3页 Global Electronics China
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同被引文献14

  • 1韩强.对玻璃与金属封装外壳气密性的认识[J].电子与封装,2003,3(1):49-52. 被引量:10
  • 2龙乐.MEMS封装技术的发展及应用[J].电子与封装,2005,5(3):1-5. 被引量:6
  • 3Margomenos A,Peroulis D,Becker J P, et al. Silicon micromachined interconnects for on-wafer packaging of MEMS devices. Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 2001.
  • 4Wilkerson P, Kranz M ,Przekwas A ,et al Flip-Chip hermetic packaging of RF MEMS. Microelectromechanical Systems Conference, 2001.
  • 5Van Spengen W M, Czarnecki P, Poets R , et al. The influence of the package environment on the functioning and reliability of RF MEMS switches. IEEE International Reliability Physics Symposium, 2005.
  • 6Margomenos A, Katehi L P B. Fabrication and Accelerated Hermeticity Testing of an On-Wafer Package for RF MEMS. IEEE Microwave Theory and Techniques Society ,2004.
  • 7Carchon G, Jourdain A, Vendier O,et al. Integration of 0/1-Level Packaged RF-MEMS Devices on MCM-D at Millimeter-Wave Frequencies Electronic Components and Technology, 2005.
  • 8Jourdain A, De Moor P, Pamidighantarn S. Investigation of The hermeticity of BCB-sealed cavities for housing RF MEMS devices. The Fifteenth IEEE International Conference on Micro Electro Mechanical Systems, 2002.
  • 9Thompson D, Kingsley N, Guoan Wang ,et al Rfcharacteristics of thin film liquid crystal polymer (LCP) packages for RF MEMS and MMIC integration. IEEE MTT-S International Microwave Symposium Digest, 2005.
  • 10Jourdain A , Rottenberg X , Carchon G , et al. Optimization of 0-level packaging for RF MEMS device. 12th International Conference on Transducers Solid-State Sensors Actuators and Microsystems 2003.

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