期刊文献+
任意字段
题名或关键词
题名
关键词
文摘
作者
第一作者
机构
刊名
分类号
参考文献
作者简介
基金资助
栏目信息

芯片级电磁兼容性的设计方法及其应用 被引量：4

Design Methods of EMC on Chip-Level and Its Applications
下载PDF
导出
摘要 介绍了电磁兼容性的基本概念、原理及其在集成电路设计中的重要性,着重论述了芯片级电磁兼容性的设计方法,最后给出了芯片级电磁兼容性研究中存在的问题及未来的研究重点。 The basic concept, principle of EMC and its importance in IC design are introduced.Its basic design methods are presented and synthesized, and the design methods of EMC on chip-level are especially presented. Finally, the unsolved problems in the research on EMC on chip-leveland the prospect in this field are pointed out.
作者 殷和国 杨银堂 崔占东
机构地区 西安电子科技大学微电子研究所 河北半导体研究所
出处 《半导体技术》 CAS CSCD 北大核心 2004年第9期52-56,共5页 Semiconductor Technology
关键词 电磁兼容性 集成电路设计 解决法 规范法 系统法 IC EMC chip
分类号 TN402 [电子电信—微电子学与固体电子学] TN03 [电子电信—物理电子学]
  • 相关文献

参考文献20

  • 1[1]VIOLETTE J L N, et al. Electromagnetic compatibility handbook[M]. New York: Van Nostrand Reinhold Company,1997.
  • 2[2]ROBINSON M P, FISCHER K, FLINTOFT I D, et al.A simple model of EMI-Induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance[J]. IEEE Trans on Electromagnetic Compatibility, 2003,45(3):513-519.
  • 3[3]WESTON D A. Electromagnetic Compatibility[M].Marcel Dekker Inc, 2000.342-353.
  • 4[4]WU T L, CHEN S T, HUANG J N, et al. Numerical and experimental investigation of radiation caused by the switching noise on the partitioned dc reference planes of high speed digital PCB[J].IEEE Trans on Electromagnetic Compatibility, 2004,46(1):33-45.
  • 5[5]IEC 61967-1-2001.Integrated Circuits -Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 1: General conditions and definitions.47A/632/FDIS[S]..
  • 6[6]IEC 62132-1-2001.Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1GHz Part 1: General and definitions.47A/618/CD[S]..
  • 7[7]IEC 61967-2 .Integrated Circuits -Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz - Part 2:Mesurement of Radiated Emissions, TEM-cell method(150kHz to 8 GHz) .47A/619/NP1[S].
  • 8[8]KA.ST J P, GROH C; GARBE H. Calculable field generation using TEM cells applied to the calibration of a novel E-field probe[J]. IEEE trans on Electromagnetic Compatibility, 2002, 44(1):59.
  • 9[9]IEC 61967-4-2002.01-18.Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz -Part 4:Measurement of Conducted Emissions 1/ 150 Direct Coupling Method.47A/636/FDIS[S].
  • 10[10]IEC 61967-6.IEC 61967-6-2000.11-10, Integrated Circuits, Measurement of Electromagnetic Emissions,150kHz～1GHz,Part6:Measurement of Conducted Emissions, Magnetic Probe Method.47A/608/CDV,Committee Draft For Vote,Date of Circulation[S].

同被引文献20

  • 1郭虎岗,刘俊,马喜宏.混合集成电路的电磁兼容设计[J].微计算机信息,2008,24(2):308-309. 被引量：10
  • 2Allen P E.CMOS模拟集成电路设计[M].2版.冯军,译.北京:电子工业出版社,2005.
  • 3VAUGHAN T M. Brain-computer interface technology: A review of the second international meeting[J].IEEE Transactions on Neural System and Rehabilitation Engineering, 2003,11 (2):94-109.
  • 4NG K A, CHAN P K. A CMOS analog front-end IC for portable EEG/ECG monitoring applications[J]. IEEE Transactions on Circuits and System ( Ⅰ ) : Regular Papers, 2005,52 (11) : 2335-2347.
  • 5QIAN X B, XU Y P, I.I X P. A CMOS continuous-time low-pass notch filter for EEG systems[J]. Analog Integrated Circuits and Signal Processing, 2005,44 (3) : 231-238.
  • 6VEENDRICK H J M. Short-circuit dissipation of static CMOS circuitry and its impact on the design of buffer circuits[J].IEEE Journal of Solid-State Circuits, 1984,19 (4) : 468-473.
  • 7IEC 61967-2006 Integrated circuits,Measurement of electro-magnetic emissions.150 kHz to 1 GHz[S].2003.
  • 8IEC 62132-2006 Integrated circuits,Measurement of electro-magnetic immunity,150 kHz to 1 GHz[S].2003.
  • 9IEC 62215-2007.Integrated circuits,Measurement of impulseimmunity[S].2007.
  • 10林能毅.十六通道脑电波讯号拾取晶片之研制[D].中国台湾:中原大学,2002.

引证文献4

二级引证文献15

半导体技术
2004年 第9期

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部