一种生成组合电路故障测试集的方法

A Method for Generating Fault Test Set of Combinational Circuits

本文介绍笔者提出的一种通过寻找临界最小项获得故障检测测试集的方法.这种方法与故障表法、布尔差分法及D算法不同,只需进行普通的加、减运算及求集合的交等.而且全部计算均采用人们熟悉的十进制数.最后.还介绍了实现这种方法的计算机运行输出结果.

A method of gaining fault detection test set by means of seeking the critical minimal item is presented. The method is different from fault-list method,Boolean-difference method and D-algorithm. It is very simple because it only need to practise common addition,subtraction and intersection operations with the decimal system which is familiar to people. Finally ,the operating result on computer is also shown.