摘要
采用Sol Gel法制备了P2 O5 SiO2 快质子导电玻璃 ,用四探针薄层电阻测试仪、XRD、IR等手段对玻璃的电性能、物相结构和组成进行了表征 ,并探讨了质子导电机理。结果表明P2 O5 SiO2 快质子导电玻璃中的强氢键、分子水、结构的不完整性是导致高质子导电率的主要原因。
Protonic conducting P 2O 5-SiO 2 glasses were prepared by Sol-Gel processing. The glass's characterization was carried out by four-probe instrument for measuring sheet resistance, X-ray diffraction (XRD), infrared spectrumeter (IR), and proton conduction mechanism was discussed. The primary reasons of high proton conductivity were strong hydrogen bonding, molecular water and low degree of cross-linking structure in P 2O 5-SiO 2 glasses.
出处
《材料科学与工程学报》
CAS
CSCD
北大核心
2004年第5期742-745,共4页
Journal of Materials Science and Engineering