摘要
研究了锂卤钨磷酸盐玻璃态快离子导体的阻抗及介电常数等参量随温度、频率的变化规律,并用阻抗谱法、DTA对样品进行了分析。结果表明:当温度高于160℃时,样品电导率随温度的变化,满足Arrheius方程;高温情况下电导率随频率的增加而增加,达到一定程度后基本不变;温度较低时,低频下的电导率基本保持不变。介电常数随温度的变化,在150～200℃间变化不大,尔后增加并达极大值后减小;介电常数随频率减小而增大。此外,用AES、XPS、XRD、WF-metre对其薄膜的表面成分、价态、结构进行了研究,得悉薄膜的表面成分接近体的成分,玻璃体系的骨架是由(PO_4)和[WO_4]基团连接而成。文中还揭示了离子迁移机理和微观结构间的关系。
The impendance and dielectric properties of quaternary system lithium superionic(LSI) glass were studied, and the sample was analysed by using the complex impendance spectrum and DTA. The results indicate that the relation of temperature(T) and conductivity(σ) follows an Arrhenius behavious above 160℃ The σincreases with the frequency increasing at high temperture, and is unchanged at lower tempertures and frequencies. An increase in dielectric constant(ε) is clear in the T=200～300℃, the ε decrcases with T increasing above 300℃ and it keeps basically unchanged in T=150～200℃. In addition, the surface properties of thin film of LSI glass were studied by using AES, XPS, XRD, and WFmetre. The results show that the surface composition closes to that of bulk, the glass system networks consist of [PO_4] and [WO_4]. Meanwhile, the relation between ion migration and microstructure was discussed.
关键词
玻璃态
快离子导体
薄膜
表面
superionic glass
thin film
surface analytical technique
electrical parameter
