摘要
对MF-11型热敏电阻器的失效样品进行了比较系统的观测与实验分析,从中总结出其主要失效模式.认为它的主要失效机理有:阻值漂移及老化不足,电极有效面积减少,内部微裂纹的蔓延与扩展,非平衡态的转变过程,晶粒表面态的变化等.对提高产品的可靠性提出了改进建议.
Observations and experiments have been carried out on failed samples of the MF-11 type thermistors. The main failure modes have been summarized. It is believed that the failure mechanism includes the resistance drift, insufficiency of aging, a decrease of the effective electrode area, the extension of the insied micro-crazing, the transformation of the non-equilibrium state and the change of the surface states of the crystalline grains. To improve the re-liabtility of the MF-11 type thermistors, some recommendations are given.
出处
《华中理工大学学报》
CSCD
北大核心
1993年第2期5-9,共5页
Journal of Huazhong University of Science and Technology
关键词
热敏电阻器
失效
模式
失效机理
thermistors
failure modes
failure mechanism
effective electrode area
inside micro-crazing
