二维负磁导率材料中的缺陷效应

The defect effect in the two-dimensional negativepermeability material

研究了以金属铜六边形开口谐振环为基元的二维负磁导率材料的缺陷效应 .利用电路板刻蚀技术制备了二维负磁导率材料样品 .采用波导法测量了点缺陷和线缺陷对二维负磁导率材料X波段 (8— 12GHz)微波透射行为的影响 .实验发现 ,无缺陷的二维负磁导率材料样品存在一个谐振频率 ,在稍大于该谐振频率的极窄区域内表现为负磁导率 .点缺陷和线缺陷SRR的引入导致材料主谐振峰的强度下降、谐振频率发生移动 ,品质因数Q显著下降 .缺陷的存在破坏了材料的周期性结构 ,从而引起其谐振峰的谐振强度和谐振频率发生变化 .缺陷效应的研究不仅对了解微波段负磁导率材料的行为特征是非常重要的 。

The defect effect in the two_dimensional (2D) negative permeability material, consisting of copper hexagon split ring resonators (SRRs), is investigated. The printed circuit boards with SRRs on one side are fabricated using a shadow mask/etching technique. We use a rectangular waveguide system to measure the X_band transmission in 2D negative permeability materials with different dot and line defects. The measured data shows that there is only one resonance frequency and high quality factor \%Q\% for a 2D negative permeability material without defects. The main resonance frequency has a shift and the resonant peak value decreases when the defect SRRs are introduced into the samples. We consider that the defect SRRs break the periodic structure of the samples, which results in the shift of the main resonance frequency and the resonant intensity. The investigation of the defect effects is important not only for the understanding of the characterisfics of the negative permeability material, but also for the realization of the left_handed metamaterials in the infrared and visible region.