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应用IBAD方法制备纯钛表面多孔TCP/HA涂层材料的微观分析 被引量:5

Microcosmic analysis of TCP/HA coating with micro-pores on titanium by IBAD method
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摘要 目的:为了改善钛种植体的生物相容性,对纯钛表面沉积多孔磷酸三钙/羟基磷灰石(Tricalciumphosphate/hydroxyapatite,TCP/HA)复合涂层材料的表面结构和化学成分进行分析,并与沉积羟基磷灰石(Hydroxyapatite,HA)的钛表面进行对比。方法:用离子束辅助沉积方法(Ionbeamassisteddeposition,IBAD)在纯钛表面沉积HA和TCP/HA涂层材料,通过扫描电镜(Scanningelectronmicroscope,SEM)、原子力显微镜(Atomicforcemicroscopy,AFM)、X射线能谱分析(EnergydispersiveX-rayanalysis,EDX)以及X射线衍射(X-raydiffraction,XRD)技术,检测两种涂层材料表面的微观形态和化学成分,并进行比较。结果:SEM和AFM显示TCP/HA涂层材料表面存在多孔结构,表面化学成分分析显示TCP/HA涂层的钙磷比低于HA,XRD证实TCP/HA涂层内同时存在TCP和HA两种化合物。结论:用IBAD方法在纯钛表面成功地沉积了具有多孔结构的TCP/HA复合涂层材料,该涂层材料和基体材料的结合牢固,改善了基体材料的生物相容性,是一种有应用前景的种植体表面涂层材料。 PURPOSE: In order to improve the biocompatibility of dental implants, the physical structure and the chemical composites of tricalcium phosphate/hydroxyapatite(TCP/HA) coating on titanium were studied. METHODS: Coatings of TCP/HA and hydroxyapatite (HA) on titanium were formed by ion beam assisted deposition (IBAD) method. The scanning electron microscope (SEM) and atomic force microscope (AFM) were used to study the morphology of the coating surfaces. The chemical components and structure of the modified surfaces were characterized using energy dispersive X-ray analysis (EDX) and X-ray diffraction (XRD). RESULTS: The results showed that there were many micro-pores in the TCP/HA coating by SEM and AFM. The chemical components analysis showed that the Ca/P ratio of TCP/HA coating was lower than that of HA coating. The XRD showed that the TCP/HA coating was composed of TCP and HA. CONCLUSION: The results indicated that the TCP/HA coating with micro-pores was formed on titanium by IBAD method successfully. With higher binding strength between TCP/HA and titanium, this coating will be a potential coating material for dental implant, especially for the biological seal at the cervical level of the implant.
出处 《上海口腔医学》 CAS CSCD 2004年第5期385-388,共4页 Shanghai Journal of Stomatology
基金 国家自然科学基金(30200062)
关键词 离子束辅助沉积 磷酸三钙/羟基磷灰石 扫描电镜 原子力显微镜 X射线衍射 X射线能谱分析 Ion beam assisted deposition Tricalcium phosphate/hydroxyapatite Scanning electron microscope Atomic force microscope X-ray diffraction Energy dispersive X-ray analysis
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参考文献10

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