摘要
采用ICP AES(电感耦合等离子体 原子发射光谱法 )测定金属硅中铁杂质含量进行不确定度评估时 ,提出了平均移动极差 (MR)合并统计动态监控技术。研究认为 ,采用该技术来进行ICP AES测量系统的不确定度评估 ,其贡献量分别是由控制样品 (QC)和线性拟合两部分合成。这一结论的得出能最大限度合成各种变异因素的影响 ,避免了相关性的复杂计算 ,有利于ICP
This paper describes how to estimate the uncertainty when Fe in metallic silicon is determined by ICP-AES (Inductively Coupled Plasma Atomic Emission Spectrometry). The technique of the averaged moving range ((MR) over bar) pooled in-statistical-dynamic-monitor is proposed. The study suggests that the uncertainty contribution of ICP-AES measurement system is, by using this technique, a combination of quality control (QC) and linear fit. This conclusion maximized the combination of the effects on various variances, refrained from the complicated relativity, and favored the uncertainty evaluation for ICP-AES measurement system.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
2004年第10期1248-1252,共5页
Spectroscopy and Spectral Analysis
基金
国家商检局科学基金资助项目 (K980 2 )
关键词
移动极差
统计合并技术
监控
ICP-AES测量系统
电感耦合等离子体原子发射光谱
不确定度
金属硅
铁杂质
含量测定
ICP-AES
metallic silicon
uncertainty
MR pooled in-statistical-monitor
quality control
linear fit
AD normality statistics
autocorrelation trend analysis
moving range
exponentially weighted moving average
Horwitz equation