期刊文献+

一个描述硅原子团簇退火行为的模型

A Model Describing Annealing of Si Clusters
下载PDF
导出
摘要 在考虑硅原子团簇的尺寸对其俘获半径的影响的基础上提出了一个改进的模型 ,来描述团簇的退火行为 ,并给出了点缺陷的表面复合速率的表达式 .为了验证此模型 ,给出了动力学蒙特卡洛方法的模拟结果 ,模拟结果与实验结果相吻合 .通过表面复合速率的模拟结果和模型的对比 ,模型得到了验证 . An improved model that considering the impact of si ze of Si clusters on the capturing radius of clusters is presented to describe t he behavior of clusters under annealing.The velocity that point defects get anni hilated at surface is given out.In order to verify the model,the kinetic Monte C arlo method is used to simulate the annealing of Si clusters.The simulation resu lts agree with the experiments.The agreement between the velocity of surface ann ihilation achieved from simulation and the model validates the model.The analysi s indicates that the impact of clusters' size on the behavior of clusters under annealing is obvious.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第10期1277-1280,共4页 半导体学报(英文版)
基金 国家自然科学基金 (批准号 :60 2 0 60 0 4) 国家重点基础研究发展规划 (批准号 :G2 0 0 0 0 3 65 0 1)资助项目~~
关键词 退火 缺陷 模型 anneal def ect silicon model
  • 相关文献

参考文献5

  • 1[1]Stolk P A,Gossmann H J,Eaglesham D J,et al.Physical mechanism of transient enhanced dopant diffusion in ion-implanted silicon.J Appl Phys,1997,81(9):6031
  • 2[3]Raferty C S,Gilmer G H,Jaraiz M,et al.Simulation of cluster evaporation and transient enhanced diffusion in silicon.Appl Phys Lett,1996,68(17):2395
  • 3[4]Colombeau B,Cristiano F,Altibelli A,et al.Atomistic simulations of extrinsic defects evolution and transient enhanced diffusion in silicon.Appl Phys Lett,2001,78(7):940
  • 4[5]Ran Yajun,Gao Wenyu,Huang Ru,et al.Computer simulation on low energy ion implantation based on molecular dynamics methods.Chinese Journal of Electronics,2000,9:359
  • 5[6]Yu Min,Huang Ru,Zhang Xing,et al.Atomistic simulation of RTA annealing for shallow junction formation charactering both BED and TED.IEICE Trans Electron,2003,E86-C(3):295

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部