全速电流测试的故障精简和测试生成

Fault Collapsing and Test Generation for At-speed Current Testing

针对全速电流测试方法测试生成算法效率低下的问题 ,提出故障压缩、故障模拟等故障精简的方法 ,以提高该方法的测试生成效率 实验结果表明 ,该方法使得需要进行测试生成的故障点平均减少了 6 6 8% ,该测试方法的测试生成的效率提高了 2 0

Though the dynamic current testing can cover more faults than I DDQ , it requires a very high speed automatic test equipment (ATE) or a high quality sensor for on-line testing, which is not available at present The method of at-speed current testing applies two alternative vectors to the circuits under test to enable the possibility for using a slow measurement and testing-at a high frequency operation This paper proposes some techniques for fault collapsing for stuck-open faults, and their application to test generation for at-speed current testing Experimental results show that the test generation efficiency is improved by 200 times through employment of the fault collapsing techniques