摘要
边界扫描测试技术很好地解决了VLSI电路诊断、测试的困难问题,得到了广泛的应用。作者在查阅大量文献资料的基础上,总结出了边界扫描技术在提高电路板可测试性上的两种优化问题:即设计过程中设计复杂性和测试性改善的优化,以及在测试生成算法中紧凑性与完备性优化的问题,论文详细分析了这两种问题,分析比较了相关的优化算法,并对这两种优化问题未来的发展方向进行了预测。
Boundary-Scan test technology well resolved the problem of VLSI circuitry diagnosis and test and has gained broad applications. Two kinds of optimization problems of applying Boundary-Scan technology to improve the testability of circuit board are summarized based on reading abundant literature , namely, the optimization problem between design complexity and testability improvement in the process of design and the optimization problem between compact test vector and diagnosis capacity of test generation algorithm. These two optimization problems are analyzed in detail and pertinent optimization algorithms are compared. At last, the development trends of these two kinds of optimization problems are forecasted.
出处
《微电子学与计算机》
CSCD
北大核心
2004年第11期43-46,共4页
Microelectronics & Computer
