MB86901 SPARC RISC芯片全机行为功能级模拟策略的研究

A STRATEGY FOR WHOLE MACHINE BEHAVIORAL FUNCTIONAL LEVEL SIMULATION OF MB86901 SPARC RISC CHIP

本文提出了一种基于指令系统的MB86901 SPARC RISC芯片的行为功能级测试方法。和[2]中的方法相比,由于DCL语言自身的特点,本文给出的方法有着简洁且故障覆益率高的特色。文章扼要地介绍了MB86901的指令系统,然后按照先测试寄存器,再逐条测试单个指令,最后测试指令间关系的逻辑顺序逐步对MB86901进行测试。对于寄存器的测试,我们采用了“雨点法”,使得寄存器故障覆盖率接近100％,在最常用的算术/逻辑/移位指令的测试中,我们使用了一个随机数发生器,使故障覆盖率大为提高。而且它的使用非常灵活。最后,我们测试了指令间可能出现的关系。

This paper describes an approach to instruction system-based on behavioral functional level test of MB86901 SPARC RISC chip. The test steps are given as follow: fust, the special purpose registers and register files are tested; second, the individual instructions, and finally the possible relationship between instructions are also tested. The Reed Muller codes are used to test registers. A random number generator is presented while testing the A/L/S instructions.