原子力显微镜观察早先辐射事故受照射者染色体易位

Study of chromosome translocation in victims of a previous radiation accident by atomic force microscopy

目的 探求原子力显微镜 (AFM)在辐射诱发染色体畸变分析和结构观察等方面应用的优势 ,为深入探讨辐射损伤和癌变形成机理奠定基础。方法 利用染色体核型自动分析系统 ,研究上海“6 2 5”事故受照射者照射后 12年易位染色体的断裂点分布情况 ,选择断裂点好发部位的畸变进行AFM分析和结构观察 ,并与光学显微镜分析结果比较。结果 对易位畸变的AFM分析 ,不仅准确地判定断裂点的确切部位 ,还提供了损伤热点的高分辨三维结构。结论 AFM能够对辐射诱发染色体畸变的研究提供更多更确切的信息 ,其中损伤热点结构的观察为基因水平的深入研究提供了三维结构的依据。

Objective To explore the potentiality of atomic force microscopy in analysis of chromosome aberration,observation of chromosome structure,and study the mechanisms of radiation damage and cancer development. Methods G-banding method was used to localize break point on translocation of chromosomes from five survivors at the 12 th year after Shanghai radiation accident. The frequency of chromosome aberrations was analyzed by AFM and compared with the results observed by optical microscopy. Results AFM could not only identify the exact sites of break-point,but also display the three-dimensional structures of hot damage points by high resolving power. Conclusion AFM can provide more information for study of chromosome aberration induced by radiation,including visualizing the structures of hot damage points,as a basis of further research in genomic level.