摘要
提出了一种利用光的偏振现象对半导体光敏元件进行线性度测定的方法。该方法利用起偏器和检偏器之间的夹角与输出光强之间严格的对应关系,无须光强计和精密光路,具有操作简单、附加误差小的优点。并以3种常见的光敏元件为例,给出了光路结构、测量电路并列表给出了测量数据及其处理结果。
This paper puts forward a method of linearity determination for photosensitive elements based on optical (polarization). This method uses the strict corresponding relationship between the included angle of the polarizer and analyzer and the output light intensity and thus there is no need of photometer or precise light circuit. Also, the (method) is characterized by easy operation and small additional errors. Employing three types of common photosensitive elements as examples, the paper gives the structure of the light circuit, the measurement circuit, and the measured data and its processing results in tables, and also gets some useful conclusions.
出处
《山东交通学院学报》
CAS
2004年第3期59-62,共4页
Journal of Shandong Jiaotong University