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Advances in Localization and Molecular Markers of Wheat Leaf Rust Resistance Genes

Advances in Localization and Molecular Markers of Wheat Leaf Rust Resistance Genes
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摘要 Genetic resistance is the most economical method of reducing yield losses caused by wheat leaf rust. To identify the leaf rust resistance genes in commonly used parental germplasm and released cultivars become very important for utilizing the genetic resistance to wheat leaf rust fully. Up to date, about 90 leaf rust resistance genes have been found, of which 51 genes have been located and mapped to special chromosomes, and 56 genes have been designated officially according to the standards set forth in the Catalogue of Gene Symbols for wheat. Twenty-four wheat leaf rust resistance genes have been developed for their molecular markers. It is very important to isolate, characterize, and map leaf rust resistance genes due to the resistance losses of the genes caused by the pathogen continuously. Genetic resistance is the most economical method of reducing yield losses caused by wheat leaf rust. To identify the leaf rust resistance genes in commonly used parental germplasm and released cultivars become very important for utilizing the genetic resistance to wheat leaf rust fully. Up to date, about 90 leaf rust resistance genes have been found, of which 51 genes have been located and mapped to special chromosomes, and 56 genes have been designated officially according to the standards set forth in the Catalogue of Gene Symbols for wheat. Twenty-four wheat leaf rust resistance genes have been developed for their molecular markers. It is very important to isolate, characterize, and map leaf rust resistance genes due to the resistance losses of the genes caused by the pathogen continuously.
出处 《Agricultural Sciences in China》 CAS CSCD 2004年第10期770-779,共10页 中国农业科学(英文版)
基金 This study was supported by the National Natural Science Foundation of China(30170602) the Biological Control Center of Plant Pathogens and Plant Pests of Hebei Province.
关键词 Wheat leaf rust Resistance gene Chromosomal localization Molecular marker Wheat leaf rust, Resistance gene, Chromosomal localization, Molecular marker
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参考文献20

  • 1R.G. Saini,M. Kaur,B. Singh,Shiwani Sharma,G.S. Nanda,S.K. Nayar,A.K. Gupta,S. Nagarajan.Genes Lr48 and Lr49 for hypersensitive adult plant leaf rust resistance in wheat (Triticum aestivum L.)[J].Euphytica.2002(3)
  • 2L. Huang,B. S. Gill.An RGA – like marker detects all known Lr21 leaf rust resistance gene family members in Aegilops tauschii and wheat[J].TAG Theoretical and Applied Genetics (-).2001(6-7)
  • 3R. Prins,J. Z. Groenewald,G. F. Marais,J. W. Snape,R. M. D. Koebner.AFLP and STS tagging of Lr19, a gene conferring resistance to leaf rust in wheat[J].TAG Theoretical and Applied Genetics.2001(4)
  • 4W. J. Raupp,Sukhwinder-Singh,G. L. Brown-Guedira,B. S. Gill.Cytogenetic and molecular mapping of the leaf rust resistance gene Lr39 in wheat[J].TAG Theoretical and Applied Genetics (-).2001(2-3)
  • 5M. Helguera,I. A. Khan,J. Dubcovsky.Development of PCR markers for the wheat leaf rust resistance gene Lr47[J].TAG Theoretical and Applied Genetics.2000(7)
  • 6R. Seyfarth,C. Feuillet,G. Schachermayr,M. Winzeler,B. Keller.Development of a molecular marker for the adult plant leaf rust resistance gene Lr35 in wheat[J].TAG Theoretical and Applied Genetics (-).1999(3-4)
  • 7S. Naik,K. S. Gill,V. S. Prakasa Rao,V. S. Gupta,S. A. Tamhankar,S. Pujar,B. S. Gill,P. K. Ranjekar.Identification of a STS marker linked to the Aegilops speltoides-derived leaf rust resistance gene Lr28 in wheat[J].TAG Theoretical and Applied Genetics.1998(4)
  • 8Gabriele Schachermayr,Catherine Feuillet,Beat Keller.Molecular markers for the detection of the wheat leaf rust resistance gene Lr10 in diverse genetic backgrounds[J].Molecular Breeding.1997(1)
  • 9Catherine Feuillet,Monika Messmer,Gabriele Schachermayr,Beat Keller.Genetic and physical characterization of theLR1 leaf rust resistance locus in wheat (Triticum aestivum L.)[J].MGG Molecular & General Genetics.1995(5)
  • 10R. A. McIntosh,B. Friebe,J. Jiang,D. The,B. S. Gill.Cytogenetical studies in wheat XVI. Chromosome location of a new gene for resistance to leaf rust in a Japanese wheat-rye translocation line[J].Euphytica.1995(2)

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