摘要
用X射线衍射和透射电镜研究了用闪蒸法(Flash evaporation)在77K制备的Nd_xFe_(1-x)(X=0.06-0.90)非晶薄膜的室温稳定性及其晶化过程当0.19<X<0.50时,非晶Nd_xFe_(1-x)薄膜在室温是稳定的,晶化相呈沿膜面的薄片状生长,完全晶化后的薄膜由Nd_2Fe_(17)相和金属Nd相构成。
The room temperature stability and crystallization of amorphousNd_xFe_(1-x) thin films with x=0.06-0.90, prepared by flash evaporation at 77 K, were investi-gated by X-ray diffraction and TEM. The amorhous Nd_xFe_(1-x) films are stable at room tem-perature when 0. 19<x<0.50. Crystalline phases grow along the surface of film as very thinflakes and thicken only at relatvely high temperature. After complete crystallization, theNd_xFe_(1-x) fillms with x<0.5 are composed of Nd_2Fe_(17) and metal Nd, but no NdFe_2, a phaseought to occur by phase diagram.
出处
《金属学报》
SCIE
EI
CAS
CSCD
北大核心
1993年第4期B181-B186,共6页
Acta Metallurgica Sinica