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NANOINDENTATION OF THIN-FILM-SUBSTRATE SYSTEM DETERMINATION OF FILM HARDNESS AND YOUNG'S MODULUS 被引量:2

NANOINDENTATION OF THIN-FILM-SUBSTRATE SYSTEM DETERMINATION OF FILM HARDNESS AND YOUNG'S MODULUS
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摘要 In the present paper,the hardness and Young's modulus of film-substrate systems are determined by means of nanoindentation experiments and modified models.Aluminum film and two kinds of substrates,i.e.glass and silicon,are studied.Nanoindentation XP Ⅱ and continuous stiffness mode are used during the experiments.In order to avoid the influence of the Oliver and Pharr method used in the experiments,the experiment data are analyzed with the constant Young's modulus assumption and the equal hardness assumption.The volume fraction model(CZ model)proposed by Fabes et al.(1992)is used and modified to analyze the measured hardness.The method proposed by Doerner and Nix(DN formula)(1986)is modified to analyze the measured Young's modulus.Two kinds of modified empirical formula are used to predict the present experiment results and those in the literature,which include the results of two kinds of systems,i.e.,a soft film on a hard substrate and a hard film on a soft substrate.In the modified CZ model,the indentation influence angle,(?), is considered as a relevant physical parameter,which embodies the effects of the indenter tip radius, pile-up or sink-in phenomena and deformation of film and substrate. In the present paper,the hardness and Young's modulus of film-substrate systems are determined by means of nanoindentation experiments and modified models.Aluminum film and two kinds of substrates,i.e.glass and silicon,are studied.Nanoindentation XP Ⅱ and continuous stiffness mode are used during the experiments.In order to avoid the influence of the Oliver and Pharr method used in the experiments,the experiment data are analyzed with the constant Young's modulus assumption and the equal hardness assumption.The volume fraction model(CZ model)proposed by Fabes et al.(1992)is used and modified to analyze the measured hardness.The method proposed by Doerner and Nix(DN formula)(1986)is modified to analyze the measured Young's modulus.Two kinds of modified empirical formula are used to predict the present experiment results and those in the literature,which include the results of two kinds of systems,i.e.,a soft film on a hard substrate and a hard film on a soft substrate.In the modified CZ model,the indentation influence angle,(?), is considered as a relevant physical parameter,which embodies the effects of the indenter tip radius, pile-up or sink-in phenomena and deformation of film and substrate.
机构地区 LNM
出处 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 2004年第4期383-392,共10页 力学学报(英文版)
基金 The project supported by the National Natural Science Foundation of China (10202023,10272103),the Excellent Post-doctoral Research-starting Fund of CAS and the Key Project from CAS (No.KJCX2-SW-L2)
关键词 NANOINDENTATION HARDNESS Young's modulus film-substrate system nanoindentation hardness Young's modulus film-substrate system
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